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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 3946 - 3960 of 4352 items found.

  • PXI 8x9 RF Matrix 500MHz 50 SMB

    40-725-511 - Pickering Interfaces Ltd.

    The 40-725 is an 8x9 RF Matrix Module suitable for switching frequencies up to 500MHz (50Ω version). The 40-725 is available in either 50Ω or 75Ω versions with SMB coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connections, these disconnect the matrix from the external test fixture maximizing isolation and RF performance.

  • PXI 8x9 RF Matrix 250MHz 75 SMB

    40-725-751 - Pickering Interfaces Ltd.

    The 40-725 is an 8x9 RF Matrix Module suitable for switching frequencies up to 500MHz (50Ω version). The 40-725 is available in either 50Ω or 75Ω versions with SMB coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connections, these disconnect the matrix from the external test fixture maximizing isolation and RF performance.

  • PXIe-S5090 2-Port 9 GHz Analyzer

    PXIe-S5090 - Copper Mountain Technologies

    The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.

  • EXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz

    N5173B - Keysight Technologies

    Balance budget & performance to address parametric testing of microwave components & receiversPerform LO up conversion for microwave backhaul links or CW blocking for receiver testingMaximize test throughput with 600-s frequency switchingCharacterize microwave filters & amplifiers with the best combination of output power, low harmonics & full step attenuationUse as a high-stability system reference: the standard high-performance OCXO has an aging rate of 5x10-10 parts/day

  • Phase Sequence Indicators (Contact Type)

    862 PR - Standard Electric Works Co., Ltd

    ● Two functions in one unit: open phase and phase      sequence detection.● Neon light indicators.● Large size alligator clips for easy clipping onto switch-   boards terminals.● Checks a wide range of 3-phase power sources.● Ideal for installing conveyor lines, pump systems and    interconnected drivers.● Waterproof design, protection class : IP24.● Special test leads length are available on request.

  • EV &Recharging Testing

    Ponovo Power Co., Ltd.

    PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.

  • Multi-Interface TDM, Optical, And Packet/IP Rackmount & Probe Test Platforms

    mTOP™ - GL Communications Inc.

    Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.

  • Rack Based Test Solutions

    GL Communications Inc.

    Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

  • Electrical Probe Systems

    Instec, Inc.

    INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

  • Analog

    Microchip Technology Inc.

    Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.

  • PXIe-1086DC, 18-Slot (16 Hybrid Slots, 1 PXI Express Slot), DC Power Supply, Up to 12 GB/s PXI Chassis

    787137-01 - NI

    PXIe, 18-Slot (16 Hybrid Slots, 1 PXI Express Slot), DC Power Supply, Up to 12 GB/s PXI Chassis - The PXIe‑1086DC incorporates hot-swappable, redundant DC power supplies as well as hot-swappable, front-accessible, redundant cooling fans. These high-availability features improve the mean time between failure (MTBF) and mean time to repair (MTTR) of the PXI system. The PXIe‑1086DC monitors power supply health/voltages, air intake temperature, and fan health/speed; it provides any failure feedback with the status LEDs located on the chassis. This chassis is ideal for test, measurement, and control applications with demanding system uptime requirements.

  • MTM-IO-Serial: Software Controlled USB Hub and IO Module

    Acroname, Inc

    As part of Acroname's MTM series, the MTM-IO-Serial module is a key component to manufacturing test systems for electronic devices using a standard USB 2.0 interface, serial UARTs and one or more interface voltages. The MTM-IO-Serial module features a software controlled USB hub (USB 2.0 high-speed) with four controllable channels. Each channel has switched data and 500mA current-limited power lines.

  • MTM Evaluation Kit

    Acroname, Inc

    Get everything you need to evaluate MTM and develop your next functional test system with Acroname's MTM Evaluation Kit. The MTM Evaluation Kit includes: one MTM Development Board, one MTM USBStem Module, one MTM 1 Channel Power Module, one MTM IO Serial Module, one AC/DC 12V/5A power supply and one USB A to mini-B cable.

  • Meter Test Bench

    NEO TELE-TRONIX PVT. LTD

    Meter Test Banch is available with high-technology to ensure high testing accuracy as well as maximum functionality. It is designed to provide precise results in any simple to complex testing. It comes with modern systems to ensure to provide artificial load that cannot be changed in the power supply. It is provided with high durability and efficacy to ensure long lasting life with no maintenance. In addition to this, it ensures high accuracy in testing without any wear.

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